Fir Wednesday, February 26
3:00pm to 3:15pm

Electronics reliability is a ubiquitous challenge. FHE systems, which are manufactured using non-traditional materials and processes, and which may be subject to different failure modes than conventional systems do not have a track record or well-established set of tests to validate reliability. This talk will address current state of the art, needs, and opportunities focused on defense applications. In-process monitoring and QC of FHE devices during manufacturing is of critical importance for efficient fab operation. Metrology of printed structures and progress and state of the art for FHE metrology as well as needs and future opportunities.

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