Juan Faria-Briceno

I, Dr. Faria-Briceno, earned a Baccalaureate of Science in Electrical Engineering graduating Cum laude at the University of New Mexico in 2015. I have earned two Master of Science degrees: Optoelectronics with the Electrical and Computer Engineering Department and Photonics Optical Science and Engineering. I, Dr. Faria-Briceno, also earned a PhD in Optoelectronics (Electrical and Computer Engineering) with Dissertation Honors at the University of New Mexico. My area of expertise is Optical Angular Scatterometry in which I have multiple first author peer-reviewed papers in international journals. I am a co-inventor of one published international patent and one provisional on optical metrology system for R2R nano-manufacturing applications. Currently, I work as a Post-doctoral Fellow at the University of New Mexico developing and optimizing new metrology approaches for real-time nano-manufacturing processes.